[ASAP] Performance and Reliability Improvement under High Current Densities in Black Phosphorus Transistors by Interface Engineering ACS Applied Materials & InterfacesDOI: 10.1021/acsami.8b16507 Published in: "Applied Materials and Interfaces".admin2018-12-26T22:35:01+00:00December 26th, 2018|Categories: Publications|Tags: Phosphorene| Share This Story, Choose Your Platform! FacebookTwitterLinkedInEmail Related Posts