Graphene aerogel (GA) is a promising material for thermal management applications across many fields due to its lightweight and thermally insulative properties. However, standard values for important thermal properties, such as thermal conductivity, remain elusive due to the lack of reliable characterization techniques for highly porous materials. Comparative infrared thermal microscopy (CITM) is an attractive technique to obtain thermal conductance values of porous materials like GA, due to its non-invasive character, which requires no probing of, or contact with, the often-delicate structures and frameworks. In this study, we improve upon CITM by utilizing a higher resolution imaging setup and reducing the need for pore-filling coating of the sample (previously used to adjust for emissivity). This upgraded setup, verified by characterizing porous silica aerogel, allows for a more accurate confirmation of the fundamental thermal conductivity value of GA while still accounting for the thermal resistance at material boundaries. Using this improved method, we measure a thermal conductivity below 0.036 W/m$cdot$K for commercial GA using multiple reference materials. These measurements demonstrate the impact of higher resolution thermal imaging to improve accuracy in low density, highly porous materials characterization. This study also reports thermal conductivity for much lower density (less than 15 mg/cm$^3$) GA than previously published studies while maintaining the robustness of the CITM technique.
Published : "arXiv Mesoscale and Nanoscale Physics".